New Method to Determine Mechanical Stiffness and Strength of Centimeter-Scale Atom Thick Graphene

Home / News / New Method to Determine Mechanical Stiffness and Strength of Centimeter-Scale Atom Thick Graphene

An international team of scientists led by UNIST has successfully developed a method to measure the tensile strength of centimeter-scale monolayer graphene for the first time, using camphor as a naturally-volatilizing support.

Until now, it was difficult to determine the mechanical properties of monolayer graphene pieces, as they are bigger than a few micrometers. Therefore, moving such an ultrathin film to a standard testing apparatus has not been possible.

Now, scientists under the guidance of Professor Rodney S. Ruoff from Center for Multidimensional Carbon Materials (CMCM), within the Institute for Basic Science (IBS) at UNIST, have unveiled new and impressive characteristics of ultrathin films of graphene. Those specifications involve: the combination of graphene’s transparency, impermeability, conductivity, and elasticity could be used for flexible electronics, transparent protective coatings, and barrier films.

Read the full article here.

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